Tools for reviewing semiconductor wafer test data: rendering wafer maps, computing yield and spatial statistics, and browsing STDF/ATDF/CSV/JSON/Parquet test results.

📣 What's New — a curated, plain-language timeline of new capabilities across both projects.

Want to look at wafer data? → tsmap

A finished, free, MIT-licensed application. Open STDF, ATDF, CSV, JSON or Parquet (plus .gz/.zip) and get interactive yield maps, parametric heat maps, findings, a chart suite, lot galleries and exportable reports — no code, no account, no upload. Native installers for Linux, macOS and Windows, and a no-install browser build where files are still parsed entirely on your own machine. Most people want this one. Open in the browser · Releases · Docs

Building an application? → wafermap — @wafertools/wafermap on npm

The rendering and analysis library tsmap is built on. Interactive wafer map visualization and yield analysis: hard bins, soft bins, test values, retests, edge exclusion, reticle overlays, spatial statistics, failure clustering and lot-level trend analysis — pure ES modules, no runtime dependencies, no server required. Two calls render a working map.

Reach for it when you need wafer maps inside your own application, a data source tsmap doesn't read, or behaviour it doesn't offer — you can always start with tsmap and integrate later. Docs · Quick Start · npm

Both are written by Paul Robins, after nearly four decades in semiconductor test — most of it building test data analysis tools: wafer map and chart viewers, and the platforms they were built on. That work leaned on free software throughout, and these projects are some of it going back the other way. Both are MIT licensed. More →

Questions, ideas, or want to show off a wafer map you built? Use GitHub Discussions — open to anyone using either project.