refactor: serial params rename + 3-phase throughput test#8
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Phase 1 - Parameter Renaming: - chunk_size → upload_chunk_size + download_chunk_size (split) - tx_chunk_size → serial_tx_fragment_size - tx_chunk_delay → serial_tx_fragment_delay (default 2ms) - verify_crc removed (always verify) Phase 2 - 3-Phase Serial Throughput Test: - Phase 1: TX fragment probe (detect if fragmentation needed) - Phase 2: Upload chunk probe (find shell buffer limit) - Phase 3: Download chunk probe via new echoback command Device firmware (fl.c): - Add echoback command: fills send buffer with pattern, returns base64+CRC for download direction testing Frontend: - Simplified test result dialog (confirm with recommended params) - Remove unused i18n keys (current_chunk_size, etc.) All 1941 tests pass, format/lint clean.
- Add cmd_args_t struct to consolidate all parsed arguments - Add cmd_handler_t function pointer type - Change all cmd_* signatures to int cmd_xxx(fl_context_t*, const cmd_args_t*) - Move argument validation into each cmd_* (no more handle_* wrappers) - Replace if-else command dispatch with s_cmd_table[] lookup - Print available commands when --cmd is missing - Add echoback command tests (8 cases) in test_fl.c
- Add verify_crc case to onConfigItemChange dispatch - Add 'Max working size' output to fpbTestSerial results - Update test element IDs: chunkSize -> uploadChunkSize - Fix stale schema key: tx_chunk_delay -> serial_tx_fragment_delay - Align test expectations with current output messages
Replace hardcoded FL_B64_BUF_SIZE=2048 with computed ((FL_BUF_SIZE + 2) / 3 * 4 + 1), saving 679 bytes when FL_BUF_SIZE=1024 (1369 vs 2048).
Add max_retries=3 to _phase_fragment_probe, _phase_upload_probe, and _phase_download_probe. Each test size is retried on failure to reduce false negatives from transient serial errors.
Reduce upload probe max_size from 4096 to 1024 to avoid triggering UART DMA Bus Fault on BES O62 when buffer is near capacity. Signed-off-by: VIFEX <vifextech@foxmail.com>
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Phase 1 - Parameter Renaming:
Phase 2 - 3-Phase Serial Throughput Test:
Device firmware (fl.c):
Frontend:
All 1941 tests pass, format/lint clean.